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Fractal-Stereometric Correlation of Nanoscale Spatial Patterns of GdMnO<sub>3</sub> Thin Films Deposited by Spin Coating

dc.contributor.authorYonny Romaguera-Barcelay
dc.contributor.authorŞtefan Ţălu
dc.contributor.authorRobert Saraiva Matos
dc.contributor.authorRosane Maria Pessoa Betânio Oliveira
dc.contributor.authorJoaquim Agostinho Moreira
dc.contributor.authorJavier Perez de Cruz
dc.contributor.authorHenrique Duarte da Fonseca Filho
dc.contributor.otherLaboratory of Nanomaterials Synthesis and Nanoscopy, Physics Department, Federal University of Amazonas, Amazonas 69067-005, Brazil
dc.contributor.otherThe Directorate of Research, Development and Innovation Management (DMCDI), Technical University of Cluj-Napoca, 15 Constantin Daicoviciu St., 400020 Cluj-Napoca, Romania
dc.contributor.otherDepartment of Materials Science and Engineering, Federal University of Sergipe, São Cristóvão, Sergipe 49100-000, Brazil
dc.contributor.otherDepartment of Materials Science and Engineering, Federal University of Sergipe, São Cristóvão, Sergipe 49100-000, Brazil
dc.contributor.otherIFIMUP and Departamento de Física e Astronomia da Universidade do Porto, Rua do Campo Alegre s/n, 4169-007 Porto, Portugal
dc.contributor.otherInstituto de Soldadura e Qualidade, Av. Prof. Dr. Cavaco Silva, 2740-120 Porto Salvo, Portugal
dc.contributor.otherLaboratory of Nanomaterials Synthesis and Nanoscopy, Physics Department, Federal University of Amazonas, Amazonas 69067-005, Brazil
dc.date.accessioned2021-04-26T00:02:42Z
dc.date.available2025-10-02T04:17:05Z
dc.date.issued01-04-2021
dc.identifier.issn-
dc.identifier.urihttps://www.mdpi.com/2076-3417/11/9/3886
dc.description.abstractMultiferroic systems are of great interest for technological applications. To improve the fabrication of thin films, stereometric and fractal analysis of surface morphology have been extensively performed to understand the influence of physical parameters on the quality of spatial patterns. In this work, GaMnO<sub>3</sub> was synthesized and thin films were deposited on Pt(111)/TiO<sub>2</sub>/SiO<sub>2</sub>/Si substrates using a spin coating apparatus to study the correlation between their stereometric and fractal parameters. All films were studied by X-ray diffraction (XRD), where the structure and microstructure of the film sintered at 850 °C was investigated by Rietveld refinement. Topographic maps of the films were obtained using an atomic force microscope (AFM) in tapping mode. The results show that the film sintered at 850 °C exhibited a clear formation of a GdMnO<sub>3</sub> orthorhombic structure with crystallite size of ~14 nm and a microstrain higher than other values reported in the literature. Its surface morphology presented a rougher topography, which was confirmed by the height parameters. Topographic differences due to different asymmetries and shapes of the height distributions between the films were observed. Specific stereometric parameters also showed differences in the morphology and microtexture of the films. Qualitative rendering obtained by commercial image processing software revealed substantial differences between the microtextures of the films. Fractal and advanced fractal parameters showed that the film sintered at 850 °C had greater spatial complexity, which was due to their higher topographic roughness, lower surface percolation and greater topographic uniformity, being dominated by low dominant special frequencies. Our combination of stereometric and fractal measurements can be useful to improve the fabrication process by optimizing spatial patterns as a function of the sintering temperature of the film.
dc.format-
dc.language.isoEN
dc.publisherMDPI AG
dc.relation.uri['https://www.sciencedirect.com/journal/transplantation-reports', 'https://www.elsevier.com/authors/open-access/choice#waivers', 'https://www.sciencedirect.com/journal/transplantation-reports/publish/guide-for-authors']
dc.rights['CC BY', 'CC BY-NC-ND', 'CC BY-NC']
dc.subject['organ', 'tissue and cell transplantation', 'Surgery', 'RD1-811']
dc.subject.lccTechnology
dc.titleFractal-Stereometric Correlation of Nanoscale Spatial Patterns of GdMnO<sub>3</sub> Thin Films Deposited by Spin Coating
dc.typeArticle
dc.description.keywordsGdMnO<sub>3</sub>
dc.description.keywordsmorphology
dc.description.keywordstopography
dc.description.keywordsstereometric and fractal analysis
dc.description.pages-
dc.description.doi10.3390/app11093886
dc.title.journalApplied Sciences
dc.identifier.e-issn2076-3417
dc.identifier.oaioai:doaj.org/journal:b4c7113f3b934ca980633f167ab81e9e
dc.journal.infoVolume 11, Issue 9


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