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dc.contributor.author-
dc.date.accessioned2025-10-02T05:29:55Z
dc.date.available2025-10-02T05:29:55Z
dc.date.issued2020-10-14 10:13:55+00:00
dc.identifier.issn-
dc.identifier.uri2287-4445
dc.identifier.urihttp://digilib.fisipol.ugm.ac.id/repo/handle/15717717/35425
dc.description.abstract-
dc.format-
dc.language.isoEN
dc.publisherSpringerOpen
dc.relation.uri['https://appmicro.springeropen.com/submission-guidelines', 'https://appmicro.springeropen.com/', 'https://www.springernature.com/gp/open-research/policies/journal-policies/apc-waiver-countries', 'https://appmicro.springeropen.com/about']
dc.rightsCC BY
dc.subject['microscopy', 'materials science', 'instrumentation', 'electron microscopy', 'biological science', 'Microscopy', 'QH201-278.5']
dc.titleApplied Microscopy
dc.typeArticle
dc.identifier.oaioai:doaj.org/journal:83efbe293be24596bcad67b46ce13975
dc.journal.info-


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