dc.contributor.author | - | |
dc.date.accessioned | 2025-10-02T05:29:55Z | |
dc.date.available | 2025-10-02T05:29:55Z | |
dc.date.issued | 2020-10-14 10:13:55+00:00 | |
dc.identifier.issn | - | |
dc.identifier.uri | 2287-4445 | |
dc.identifier.uri | http://digilib.fisipol.ugm.ac.id/repo/handle/15717717/35425 | |
dc.description.abstract | - | |
dc.format | - | |
dc.language.iso | EN | |
dc.publisher | SpringerOpen | |
dc.relation.uri | ['https://appmicro.springeropen.com/submission-guidelines', 'https://appmicro.springeropen.com/', 'https://www.springernature.com/gp/open-research/policies/journal-policies/apc-waiver-countries', 'https://appmicro.springeropen.com/about'] | |
dc.rights | CC BY | |
dc.subject | ['microscopy', 'materials science', 'instrumentation', 'electron microscopy', 'biological science', 'Microscopy', 'QH201-278.5'] | |
dc.title | Applied Microscopy | |
dc.type | Article | |
dc.identifier.oai | oai:doaj.org/journal:83efbe293be24596bcad67b46ce13975 | |
dc.journal.info | - | |